Full metadata record
DC Field | Value | Language |
dc.contributor.author | 이정수 | - |
dc.date.accessioned | 2018-06-19T05:03:18Z | - |
dc.date.available | 2018-06-19T05:03:18Z | - |
dc.date.created | 2016-12-20 | - |
dc.date.issued | 2016-08-23 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/72362 | - |
dc.publisher | IEEE NANO | - |
dc.relation.isPartOf | 16th INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY(IEEE NANO 2016) | - |
dc.title | Effects of Work-function Variation on Analog Figures-of-merits of Inversion-mode and Junctionless Nanowire Transistors | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 16th INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY(IEEE NANO 2016) | - |
dc.citation.conferenceDate | 2016-08-22 | - |
dc.citation.conferencePlace | JA | - |
dc.citation.title | 16th INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY(IEEE NANO 2016) | - |
dc.contributor.affiliatedAuthor | 이정수 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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