Parallel Testable Design of Neighbor Pattern Sensitive Faults in High Density DRAMs
- Title
- Parallel Testable Design of Neighbor Pattern Sensitive Faults in High Density DRAMs
- Authors
- 홍성제
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/87460
- Article Type
- Conference
- Citation
- 2005 IEEE International Symposium on Circuits and Systems, page. 5854 - 5857
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- There are no files associated with this item.
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