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Conference
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dc.contributor.author홍성제-
dc.date.accessioned2018-06-22T04:07:05Z-
dc.date.available2018-06-22T04:07:05Z-
dc.date.created2009-03-27-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/87473-
dc.publisher한국정보과학회-
dc.relation.isPartOf제31회 추계학술발표회-
dc.relation.isPartOf제31회 추계학술대회-
dc.title대용량 메모리의 이웃 패턴 감응 고장의 효율적 테스팅을 위한 메모리 구조-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation제31회 추계학술발표회-
dc.citation.conferenceDate2004-10-22-
dc.citation.conferencePlaceKO-
dc.citation.title제31회 추계학술발표회-
dc.contributor.affiliatedAuthor홍성제-
dc.description.journalClass2-
dc.description.journalClass2-

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홍성제HONG, SUNG JE
Div of IT Convergence Enginrg
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