New Multifrequency Capacitance Extraction Methodology for Leaky MOS Capacitor with High-k Dielectric and Metal Gate
- Title
- New Multifrequency Capacitance Extraction Methodology for Leaky MOS Capacitor with High-k Dielectric and Metal Gate
- Authors
- 정윤하
- Publisher
- Austin , USA
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/88166
- Article Type
- Conference
- Citation
- 5th International Symposium on Advanced Gate Stack Technology (ISAGST 2008), page. 4
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.