A 15-Valued Fast Test Generation for Combinational Circuits
- Title
- A 15-Valued Fast Test Generation for Combinational Circuits
- Authors
- 홍성제
- Date Issued
- 1993-11-01
- Publisher
- Beijing, China
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/88987
- Article Type
- Conference
- Files in This Item:
- There are no files associated with this item.
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