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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정홍 | - |
| dc.date.accessioned | 2018-06-23T13:13:02Z | - |
| dc.date.available | 2018-06-23T13:13:02Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/89979 | - |
| dc.relation.isPartOf | The 2008 International Conference on Convergence and Information Technology | - |
| dc.relation.isPartOf | The 2008 International Conference on Convergence and Information Technology | - |
| dc.title | Self-inspection for Defect Detection in Photomask Image | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | The 2008 International Conference on Convergence and Information Technology, pp.364 - 368 | - |
| dc.citation.conferenceDate | 2008-11-11 | - |
| dc.citation.endPage | 368 | - |
| dc.citation.startPage | 364 | - |
| dc.citation.title | The 2008 International Conference on Convergence and Information Technology | - |
| dc.contributor.affiliatedAuthor | 정홍 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 정홍JEONG, HONG
- Dept of Electrical Enginrg