Microstructure of dislocation slip-band in p/p+ Si (001) by white beam diffraction topography and x-ray diffractometry
- Title
- Microstructure of dislocation slip-band in p/p+ Si (001) by white beam diffraction topography and x-ray diffractometry
- Authors
- 제정호
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/91666
- Article Type
- Conference
- Citation
- E-MRS Fall Meeting 2004
- Files in This Item:
- There are no files associated with this item.
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