Full metadata record
DC Field | Value | Language |
dc.contributor.author | 제정호 | - |
dc.date.accessioned | 2018-06-25T13:01:37Z | - |
dc.date.available | 2018-06-25T13:01:37Z | - |
dc.date.created | 2009-03-27 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/91667 | - |
dc.publisher | Shanghai Institute of Applied Physics | - |
dc.relation.isPartOf | Invited Lecture | - |
dc.relation.isPartOf | Invited Lecture | - |
dc.title | Microradiology/microtomography using synchrotron x-rays | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | Invited Lecture | - |
dc.citation.conferenceDate | 2004-09-06 | - |
dc.citation.title | Invited Lecture | - |
dc.contributor.affiliatedAuthor | 제정호 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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