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Cited 91 time in webofscience Cited 101 time in scopus
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dc.contributor.authorKim, JK-
dc.contributor.authorGessmann, T-
dc.contributor.authorLuo, H-
dc.contributor.authorSchubert, EF-
dc.date.accessioned2015-06-25T01:09:52Z-
dc.date.available2015-06-25T01:09:52Z-
dc.date.created2009-09-07-
dc.date.issued2004-05-31-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000018785en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9460-
dc.description.abstractA GaInN light-emitting diode (LED) employing an omni-directional reflector (ODR) is presented. The ODR consists of a RuO2 ohmic contact to p-type GaN, a quarter-wave thick SiO2 low-index layer perforated by an array of micro-contacts, and an Ag layer. Calculations predict a 98% angle-averaged reflectivity at lambda=450 nm for an GaN/SiO2/Ag ODR, much higher than that for a 20 period Al0.25Ga0.75N/GaN distributed Bragg reflector (49%) and an Ag reflector (94%). It is shown that the RuO2/SiO2/Ag ODR has higher reflectivity than Ni/Au and even Ag reflectors, leading to a higher light extraction efficiency of GaInN LEDs with ODR. The electrical properties of the ODR-LED are comparable to those LEDs with a conventional Ni/Au contact. (C) 2004 American Institute of Physics.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleGaInN light-emitting diodes with RuO2/SiO2/Ag omni-directional reflector-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.1757634-
dc.author.googleKim, JKen_US
dc.author.googleGessmann, Ten_US
dc.author.googleSchubert, EFen_US
dc.author.googleLuo, Hen_US
dc.relation.volume84en_US
dc.relation.issue22en_US
dc.relation.startpage4508en_US
dc.relation.lastpage4510en_US
dc.contributor.id10100864en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.84, no.22, pp.4508 - 4510-
dc.identifier.wosid000221537500050-
dc.date.tcdate2019-01-01-
dc.citation.endPage4510-
dc.citation.number22-
dc.citation.startPage4508-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume84-
dc.contributor.affiliatedAuthorKim, JK-
dc.identifier.scopusid2-s2.0-3042702992-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc81-
dc.description.scptc87*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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김종규KIM, JONG KYU
Dept of Materials Science & Enginrg
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