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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jeon, S | - |
| dc.contributor.author | Thundat, T | - |
| dc.date.accessioned | 2015-06-25T01:10:00Z | - |
| dc.date.available | 2015-06-25T01:10:00Z | - |
| dc.date.created | 2009-09-30 | - |
| dc.date.issued | 2004-08-09 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.other | 2015-OAK-0000016598 | en_US |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/9462 | - |
| dc.description.abstract | A multiple-point deflection technique has been developed for the instant measurement of microcantilever curvature. Eight light-emitting diodes are focused on various positions of a gold-coated silicon cantilever through optical fibers, and temperature change or chemical adsorption induces cantilever bending. The deflection at each point on the cantilever is measured with subnanometer precision by a position-sensitive detector, and thus the curvature of the cantilever is obtained. (C) 2004 American Institute of Physics. | - |
| dc.description.statementofresponsibility | open | en_US |
| dc.language | English | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.relation.isPartOf | APPLIED PHYSICS LETTERS | - |
| dc.rights | BY_NC_ND | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
| dc.title | INSTANT CURVATURE MEASUREMENT FOR MICROCANTILEVER SENSORS | - |
| dc.type | Article | - |
| dc.contributor.college | 화학공학과 | en_US |
| dc.identifier.doi | 10.1063/1.1781389 | - |
| dc.author.google | Jeon, S | en_US |
| dc.author.google | Thundat, T | en_US |
| dc.relation.volume | 85 | en_US |
| dc.relation.issue | 6 | en_US |
| dc.relation.startpage | 1083 | en_US |
| dc.relation.lastpage | 1084 | en_US |
| dc.contributor.id | 10132035 | en_US |
| dc.relation.journal | APPLIED PHYSICS LETTERS | en_US |
| dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
| dc.relation.sci | SCI | en_US |
| dc.collections.name | Journal Papers | en_US |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.85, no.6, pp.1083 - 1084 | - |
| dc.identifier.wosid | 000223109500078 | - |
| dc.date.tcdate | 2019-01-01 | - |
| dc.citation.endPage | 1084 | - |
| dc.citation.number | 6 | - |
| dc.citation.startPage | 1083 | - |
| dc.citation.title | APPLIED PHYSICS LETTERS | - |
| dc.citation.volume | 85 | - |
| dc.contributor.affiliatedAuthor | Jeon, S | - |
| dc.identifier.scopusid | 2-s2.0-4344607650 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.wostc | 26 | - |
| dc.description.scptc | 27 | * |
| dc.date.scptcdate | 2018-10-274 | * |
| dc.type.docType | Article | - |
| dc.subject.keywordPlus | SURFACE STRESS | - |
| dc.subject.keywordPlus | THIN-FILMS | - |
| dc.subject.keywordPlus | FREQUENCY | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
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Related Researcher
- 전상민JEON, SANGMIN
- Dept. of Chemical Enginrg