DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han, SY | - |
dc.contributor.author | Lee, JL | - |
dc.date.accessioned | 2015-06-25T01:10:26Z | - |
dc.date.available | 2015-06-25T01:10:26Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2004-09-27 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.other | 2015-OAK-0000004578 | en_US |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/9469 | - |
dc.description.statementofresponsibility | open | en_US |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.relation.isPartOf | APPLIED PHYSICS LETTERS | - |
dc.rights | BY_NC_ND | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
dc.title | Response to "Comment on 'Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy'" [Appl. Phys. Lett. 85, 2661 (2004)] | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | en_US |
dc.identifier.doi | 10.1063/1.1795356 | - |
dc.author.google | Han, SY | en_US |
dc.author.google | Lee, JL | en_US |
dc.relation.volume | 85 | en_US |
dc.relation.issue | 13 | en_US |
dc.relation.startpage | 2663 | en_US |
dc.relation.lastpage | 2664 | en_US |
dc.contributor.id | 10105416 | en_US |
dc.relation.journal | APPLIED PHYSICS LETTERS | en_US |
dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
dc.relation.sci | SCI | en_US |
dc.collections.name | Journal Papers | en_US |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.85, no.13, pp.2663 - 2664 | - |
dc.identifier.wosid | 000224178300072 | - |
dc.date.tcdate | 2018-03-23 | - |
dc.citation.endPage | 2664 | - |
dc.citation.number | 13 | - |
dc.citation.startPage | 2663 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 85 | - |
dc.contributor.affiliatedAuthor | Lee, JL | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.type.docType | Editorial Material | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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