DC Field | Value | Language |
---|---|---|
dc.contributor.author | Poxson, DJ | - |
dc.contributor.author | Mont, FW | - |
dc.contributor.author | Schubert, MF | - |
dc.contributor.author | Kim, JK | - |
dc.contributor.author | Schubert, EF | - |
dc.date.accessioned | 2015-06-25T01:20:06Z | - |
dc.date.available | 2015-06-25T01:20:06Z | - |
dc.date.created | 2009-09-03 | - |
dc.date.issued | 2008-09-08 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.other | 2015-OAK-0000018602 | en_US |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/9616 | - |
dc.description.abstract | We propose an analytic model that accurately predicts the porosity and deposition rate of nanoporous films grown by oblique-angle deposition. The model employs a single fitting parameter and takes into account geometrical factors as well as surface diffusion. We have determined the porosity and deposition rate from the measured refractive index and thickness of SiO(2) and indium tin oxide nanoporous films deposited at various incident angles. Comparison of experimental data with the model reveals excellent agreement. The theoretical model allows for the predictive control of refractive index, porosity, and deposition rate for a wide range of deposition angles and materials. (C) 2008 American Institute of Physics. | - |
dc.description.statementofresponsibility | open | en_US |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.relation.isPartOf | APPLIED PHYSICS LETTERS | - |
dc.rights | BY_NC_ND | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
dc.title | Quantification of porosity and deposition rate of nanoporous films grown by oblique-angle deposition | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | en_US |
dc.identifier.doi | 10.1063/1.2981690 | - |
dc.author.google | Poxson, DJ | en_US |
dc.author.google | Mont, FW | en_US |
dc.author.google | Schubert, EF | en_US |
dc.author.google | Kim, JK | en_US |
dc.author.google | Schubert, MF | en_US |
dc.relation.volume | 93 | en_US |
dc.relation.issue | 10 | en_US |
dc.contributor.id | 10100864 | en_US |
dc.relation.journal | APPLIED PHYSICS LETTERS | en_US |
dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
dc.relation.sci | SCI | en_US |
dc.collections.name | Journal Papers | en_US |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.93, no.10 | - |
dc.identifier.wosid | 000259797000034 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.number | 10 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 93 | - |
dc.contributor.affiliatedAuthor | Kim, JK | - |
dc.identifier.scopusid | 2-s2.0-51749120973 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 61 | - |
dc.description.scptc | 65 | * |
dc.date.scptcdate | 2018-10-274 | * |
dc.type.docType | Article | - |
dc.subject.keywordPlus | LOW-REFRACTIVE-INDEX | - |
dc.subject.keywordPlus | PERFECT ANTIREFLECTION COATINGS | - |
dc.subject.keywordPlus | REFLECTION | - |
dc.subject.keywordPlus | LIGHT | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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