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Cited 23 time in webofscience Cited 29 time in scopus
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dc.contributor.authorYoo, J-
dc.contributor.authorLee, CH-
dc.contributor.authorDoh, YJ-
dc.contributor.authorJung, HS-
dc.contributor.authorYi, GC-
dc.date.accessioned2015-06-25T01:22:45Z-
dc.date.available2015-06-25T01:22:45Z-
dc.date.created2010-03-31-
dc.date.issued2009-06-01-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000020333en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9658-
dc.description.abstractWe introduce a modulation-doping method to control electrical characteristics of ZnO nanorods. Compared with a conventional homogeneous doping method, the modulation-doping method generates localized doping layers along the circumference in ZnO nanorods, useful for many device applications. Here, we investigated electrical, structural, and optical characteristics of Ga-doped ZnO nanorods with the dopant modulation layers. Electrical conductivity of ZnO nanorods was controlled by changing either dopant mole fraction or the number of modulation-doped layers. Furthermore, the modulation-doped nanorod field effect transistors exhibited precisely controlled conductance in the order of magnitude without degradation of electron mobility. The effects of the doping on structural and optical characteristics of the nanorods are also discussed.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleModulation doping in ZnO nanorods for electrical nanodevice applications-
dc.typeArticle-
dc.contributor.collegeBK21물리사업단en_US
dc.identifier.doi10.1063/1.3148666-
dc.author.googleYoo, Jen_US
dc.author.googleLee, CHen_US
dc.author.googleYi, GCen_US
dc.author.googleJung, HSen_US
dc.author.googleDoh, YJen_US
dc.relation.volume94en_US
dc.relation.issue22en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.94, no.22-
dc.identifier.wosid000266674300062-
dc.date.tcdate2019-01-01-
dc.citation.number22-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume94-
dc.contributor.affiliatedAuthorDoh, YJ-
dc.identifier.scopusid2-s2.0-66749135154-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc21-
dc.description.scptc26*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTORS-
dc.subject.keywordPlusSINGLE-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordPlusDEPOSITION-
dc.subject.keywordAuthordoping profiles-
dc.subject.keywordAuthorelectron mobility-
dc.subject.keywordAuthorgallium-
dc.subject.keywordAuthorII-VI semiconductors-
dc.subject.keywordAuthornanostructured materials-
dc.subject.keywordAuthorsemiconductor doping-
dc.subject.keywordAuthorzinc compounds-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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