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Cited 38 time in webofscience Cited 39 time in scopus
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dc.contributor.authorSon, J-
dc.contributor.authorJalan, B-
dc.contributor.authorKajdos, AP-
dc.contributor.authorBalents, L-
dc.contributor.authorAllen, SJ-
dc.contributor.authorStemmer, S-
dc.date.accessioned2015-06-25T01:26:06Z-
dc.date.available2015-06-25T01:26:06Z-
dc.date.created2013-04-11-
dc.date.issued2011-11-07-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000027454en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9713-
dc.description.abstractModulation of the charge carrier density in a Mott material by remote doping from a highly doped conventional band insulator is proposed to test theoretical predictions of band filling control of the Mott metal-insulator transition without introducing lattice distortions or disorder, as is the case for chemical doping. The approach is experimentally tested using ultrathin (2.5 nm) NdNiO3 films that are epitaxially grown on La-doped SrTiO3 films. We show that remote doping systematically changes the charge carrier density in the NdNiO3 film and causes a moderate shift in the metal-insulator transition temperature. These results are discussed in the context of theoretical models of this class of materials exhibiting a metal-insulator transition. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3659310]-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAmerican Institute of Physics-
dc.relation.isPartOfApplied Physics Letters-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleProbing the metal-insulator transition of NdNiO3 by electrostatic doping-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.3659310-
dc.author.googleSon, Jen_US
dc.author.googleJalan, Ben_US
dc.author.googleStemmer, Sen_US
dc.author.googleAllen, SJen_US
dc.author.googleBalents, Len_US
dc.author.googleKajdos, APen_US
dc.relation.volume99en_US
dc.relation.issue19en_US
dc.contributor.id10138992en_US
dc.relation.journalApplied Physics Lettersen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationApplied Physics Letters, v.99, no.19-
dc.identifier.wosid000297030200036-
dc.date.tcdate2019-01-01-
dc.citation.number19-
dc.citation.titleApplied Physics Letters-
dc.citation.volume99-
dc.contributor.affiliatedAuthorSon, J-
dc.identifier.scopusid2-s2.0-81155144611-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc27-
dc.description.scptc25*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusDOPED MOTT INSULATORS-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusPEROVSKITES-
dc.subject.keywordPlusHOLE-
dc.subject.keywordPlusND-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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손준우SON, JUNWOO
Dept of Materials Science & Enginrg
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