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Cited 31 time in webofscience Cited 27 time in scopus
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dc.contributor.authorSadaf, SM-
dc.contributor.authorBourim, EM-
dc.contributor.authorLiu, XJ-
dc.contributor.authorChoudhury, SH-
dc.contributor.authorKim, DW-
dc.contributor.authorHwang, H-
dc.date.accessioned2015-06-25T01:28:11Z-
dc.date.available2015-06-25T01:28:11Z-
dc.date.created2013-03-08-
dc.date.issued2012-03-12-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000027042en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9747-
dc.description.abstractWe investigated the effect of a ferroelectric Pb(Zr0.52Ti0.48)O-3 (PZT) thin film on the generation of resistive switching in a stacked Pr0.7Ca0.3MnO3 (PCMO)/Nb-doped SrTiO3 (Nb:STO) heterostructure forming a p-n junction. To promote the ferroelectric effect, the thin PZT active layer was deposited on an epitaxially grown p-type PCMO film on a lattice-matched n-type Nb:STO single crystal. It was concluded that the observed resistive switching behavior in the all-perovskite Pt/PZT/PCMO/Nb:STO heterostructure was related to the modulation of PCMO/Nb:STO p-n junction's depletion width, which was caused either by the PZT ferroelectric polarization field effect, the electrochemical drift of oxygen ions under an electric field, or both simultaneously. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3694016]-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAmerican Institute of Physics Inc..-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleFerroelectricity-induced resistive switching in Pb(Zr 0.52Ti 0.48)O 3/Pr 0.7Ca 0.3MnO 3/Nb-doped SrTiO 3 epitaxial heterostructure-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.3694016-
dc.author.googleSadaf, SMen_US
dc.author.googleBourim, EMen_US
dc.author.googleHwang, Hen_US
dc.author.googleKim, DWen_US
dc.author.googleChoudhury, SHen_US
dc.author.googleLiu, XJen_US
dc.relation.volume100en_US
dc.relation.issue11en_US
dc.contributor.id10079928en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.100, no.11-
dc.identifier.wosid000302204900083-
dc.date.tcdate2019-01-01-
dc.citation.number11-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume100-
dc.contributor.affiliatedAuthorHwang, H-
dc.identifier.scopusid2-s2.0-84859945417-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc21-
dc.description.scptc17*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusMEMORY-
dc.subject.keywordPlusRETENTION-
dc.subject.keywordPlusDEVICES-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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황현상HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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