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Cited 11 time in webofscience Cited 13 time in scopus
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dc.contributor.authorHwang, JH-
dc.contributor.authorKwon, S-
dc.contributor.authorPark, J-
dc.contributor.authorKim, JH-
dc.contributor.authorLee, J-
dc.contributor.authorKim, JS-
dc.contributor.authorLyeo, HK-
dc.contributor.authorPark, JY-
dc.date.accessioned2015-06-25T01:30:31Z-
dc.date.available2015-06-25T01:30:31Z-
dc.date.created2015-03-04-
dc.date.issued2014-04-21-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000032451en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9785-
dc.description.abstractWe investigated the correlation between electrical transport and mechanical stress in a topological insulator, Bi2Te3, using conductive probe atomic force microscopy in an ultrahigh vacuum environment. After directly measuring charge transport on the cleaved Bi2Te3 surface, we found that the current density varied with applied load. Current mapping revealed a variation of the current on different terraces. The current density increased in the low-pressure regime and then decreased in the high-pressure regime. This variation of current density was explained in light of the combined effect of changes in the in-plane conductance due to spin-orbit coupling and hexagonal warping. (C) 2014 AIP Publishing LLC.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleStrain effects on in-plane conductance of the topological insulator Bi2Te3-
dc.typeArticle-
dc.contributor.college물리학과en_US
dc.identifier.doi10.1063/1.4873389-
dc.author.googleHwang, JHen_US
dc.author.googleKwon, Sen_US
dc.author.googlePark, JYen_US
dc.author.googleLyeo, HKen_US
dc.author.googleKim, JSen_US
dc.author.googleLee, Jen_US
dc.author.googleKim, JHen_US
dc.author.googlePark, Jen_US
dc.relation.volume104en_US
dc.relation.issue16en_US
dc.contributor.id10202686en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.104, no.16-
dc.identifier.wosid000335145600030-
dc.date.tcdate2019-01-01-
dc.citation.number16-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume104-
dc.contributor.affiliatedAuthorKim, JS-
dc.identifier.scopusid2-s2.0-84900332283-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc8-
dc.description.scptc9*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusSURFACE-
dc.subject.keywordPlusFRICTION-
dc.subject.keywordPlusCOEXISTENCE-
dc.subject.keywordPlusROBUSTNESS-
dc.subject.keywordPlusTRANSPORT-
dc.subject.keywordPlusADHESION-
dc.subject.keywordPlusCONTACT-
dc.subject.keywordPlusSTATES-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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