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dc.contributor.authorLEE, IN BEUM-
dc.contributor.authorJO, HANUI-
dc.contributor.authorBYEONG, EON PARK-
dc.contributor.authorJI, YUMI-
dc.date.accessioned2019-08-07T05:30:12Z-
dc.date.available2019-08-07T05:30:12Z-
dc.date.created2019-08-06-
dc.date.issued2019-07-23-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/99510-
dc.languageEnglish-
dc.publisherIEEE-
dc.relation.isPartOf2019 IEEE 17th International Conference on Industrial Informatics (INDIN)-
dc.relation.isPartOfProceedings of INDIN 2019-
dc.titleChatter Detection in Hot Strip Mill Process based on Modified Independent Component Analysis-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2019 IEEE 17th International Conference on Industrial Informatics (INDIN), pp.455 - 458-
dc.citation.conferenceDate2019-07-22-
dc.citation.conferencePlaceFI-
dc.citation.conferencePlaceAalto University-
dc.citation.endPage458-
dc.citation.startPage455-
dc.citation.title2019 IEEE 17th International Conference on Industrial Informatics (INDIN)-
dc.contributor.affiliatedAuthorLEE, IN BEUM-
dc.contributor.affiliatedAuthorJO, HANUI-
dc.contributor.affiliatedAuthorBYEONG, EON PARK-
dc.contributor.affiliatedAuthorJI, YUMI-
dc.description.journalClass1-
dc.description.journalClass1-

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