Full metadata record
DC Field | Value | Language |
dc.contributor.author | HONG, WONBIN | - |
dc.date.accessioned | 2020-04-09T05:03:03Z | - |
dc.date.available | 2020-04-09T05:03:03Z | - |
dc.date.created | 2020-04-08 | - |
dc.date.issued | 2018-11-23 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/102915 | - |
dc.publisher | 한국전자파학회 | - |
dc.relation.isPartOf | 2018년도 제 30차 종합학술대회 | - |
dc.relation.isPartOf | 2018년도 제 30차 종합학술대회 | - |
dc.title | Near-Field Free Space Characterization And Analysis for Dielectric Thickness | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 2018년도 제 30차 종합학술대회 | - |
dc.citation.conferenceDate | 2018-11-23 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.title | 2018년도 제 30차 종합학술대회 | - |
dc.contributor.affiliatedAuthor | HONG, WONBIN | - |
dc.description.journalClass | 2 | - |
dc.description.journalClass | 2 | - |
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