Near-Field Free Space Characterization And Analysis for Dielectric Thickness
- Title
- Near-Field Free Space Characterization And Analysis for Dielectric Thickness
- Authors
- HONG, WONBIN
- Date Issued
- 2018-11-23
- Publisher
- 한국전자파학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/102915
- Article Type
- Conference
- Citation
- 2018년도 제 30차 종합학술대회, 2018-11-23
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- There are no files associated with this item.
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