Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | YI, WOOSEOK | - |
| dc.contributor.author | YUL, HWA KIM | - |
| dc.contributor.author | KIM, JAE JOON | - |
| dc.date.accessioned | 2020-04-14T01:51:58Z | - |
| dc.date.available | 2020-04-14T01:51:58Z | - |
| dc.date.created | 2020-04-13 | - |
| dc.date.issued | 2019-03-29 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/103411 | - |
| dc.publisher | DATE | - |
| dc.relation.isPartOf | Design Automation and Test in Europe | - |
| dc.relation.isPartOf | Proceeding of Design Automation and Test in Europe | - |
| dc.title | Effect of Device Variation on mapping Binary Neural Network to Memristor Crossbar Array | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | Design Automation and Test in Europe | - |
| dc.citation.conferenceDate | 2019-03-25 | - |
| dc.citation.conferencePlace | IT | - |
| dc.citation.title | Design Automation and Test in Europe | - |
| dc.contributor.affiliatedAuthor | YI, WOOSEOK | - |
| dc.contributor.affiliatedAuthor | YUL, HWA KIM | - |
| dc.contributor.affiliatedAuthor | KIM, JAE JOON | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 김재준KIM, JAE JOON
- Dept. Convergence IT Engineering