Improvement of resistive switching uniformity by introducing a thin NbOx interface layer

Abstract

Uniformity is by far an important issue for the application of resistive random access memory (RRAM). In this letter, we explore a prototype RRAM device for switching uniformity improvement. Compared toW/WO3-x/Pt structure, after the introduction of a thin NbOx film between WO3-x and Pt bottom electrode, the device exhibits much better resistive hysteresis and switching uniformity. The main composition of the interface layer is NbO2 suboxide showing insulator-metal phase transition. A combined filamentary conduction model is proposed to clarify the role of NbOx layer on the resistive switching stabilization during the forming process. (C) 2012 The Electrochemical Society.