SkSP-V Sampling Plan for the Exponentiated Weibull Distribution
SCIE
SCOPUS
- Title
- SkSP-V Sampling Plan for the Exponentiated Weibull Distribution
- Authors
- Aslam, M; Rao, GS; Khan, N; Jun, CH
- Date Issued
- 2014-05
- Publisher
- AMER SOC TESTING MATERIALS
- Abstract
- The purpose of this paper is to design an SkSP-V acceptance sampling plan for assuring percentiles based on a time-truncated life test as the reference plan when the lifetime of a product follows an exponentiated Weibull distribution. Using the non-linear optimization solution, the plan parameters are determined so as to satisfy the producer's and the consumer's risks. Tables are provided for practical use and an example is shown with a real case. Finally, the results are compared with the single sampling plan in terms of the average sample number to demonstrate the efficiency of the proposed plan.
- Keywords
- exponentiated Weibull distribution; acceptance sampling; risks; percentile life; BIRNBAUM-SAUNDERS DISTRIBUTION; FAMILY; INSPECTION
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/14139
- DOI
- 10.1520/JTE20130051
- ISSN
- 0090-3973
- Article Type
- Article
- Citation
- JOURNAL OF TESTING AND EVALUATION, vol. 42, no. 3, page. 687 - 694, 2014-05
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