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Cited 17 time in webofscience Cited 14 time in scopus
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dc.contributor.authorDaeseok Lee-
dc.contributor.authorPark, J-
dc.contributor.authorJung, S-
dc.contributor.authorChoi, G-
dc.contributor.authorLee, J-
dc.contributor.authorKim, S-
dc.contributor.authorWoo, J-
dc.contributor.authorSiddik, M-
dc.contributor.authorCha, E-
dc.contributor.authorHwang, H-
dc.date.accessioned2016-03-31T08:41:51Z-
dc.date.available2016-03-31T08:41:51Z-
dc.date.created2013-03-08-
dc.date.issued2012-04-
dc.identifier.issn0741-3106-
dc.identifier.other2012-OAK-0000026968-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/15847-
dc.description.abstractFor the high-density memory application of resistive random access memory (ReRAM), we study the complementary resistive switch (CRS) behavior of a HfOx-based ReRAM with a TiOx-based ReRAM. To control the operation voltages of the CRS device, we used ReRAMs having asymmetric set and reset voltages. Consequently, we achieved a wider voltage window for the read process, high switch speed, high reliability, and more than ten times readout margin from the heterodevice CRS.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIEEE Electron Devices Society-
dc.relation.isPartOfIEEE ELECTRON DEVICE LETTERS-
dc.subjectComplementary resistive switches (CRSs)-
dc.subjectcross-point array-
dc.subjectnonvolatile memory-
dc.subjectresistive memory-
dc.subjectRRAM-
dc.subjectMEMORIES-
dc.titleOperation Voltage Control in Complementary Resistive Switches Using Heterodevice-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1109/LED.2012.2186113-
dc.author.googleLee, D-
dc.author.googlePark, J-
dc.author.googleJung, S-
dc.author.googleChoi, G-
dc.author.googleLee, J-
dc.author.googleKim, S-
dc.author.googleWoo, J-
dc.author.googleSiddik, M-
dc.author.googleCha, E-
dc.author.googleHwang, H-
dc.relation.volume33-
dc.relation.issue4-
dc.relation.startpage600-
dc.relation.lastpage602-
dc.contributor.id10079928-
dc.relation.journalIEEE ELECTRON DEVICE LETTERS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE ELECTRON DEVICE LETTERS, v.33, no.4, pp.600 - 602-
dc.identifier.wosid000302232900045-
dc.date.tcdate2019-01-01-
dc.citation.endPage602-
dc.citation.number4-
dc.citation.startPage600-
dc.citation.titleIEEE ELECTRON DEVICE LETTERS-
dc.citation.volume33-
dc.contributor.affiliatedAuthorHwang, H-
dc.identifier.scopusid2-s2.0-84862828865-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc13-
dc.description.scptc12*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordAuthorComplementary resistive switches (CRSs)-
dc.subject.keywordAuthorcross-point array-
dc.subject.keywordAuthornonvolatile memory-
dc.subject.keywordAuthorresistive memory-
dc.subject.keywordAuthorRRAM-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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황현상HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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