DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, SS | - |
dc.contributor.author | Kang, TS | - |
dc.contributor.author | Je, JH | - |
dc.date.accessioned | 2016-03-31T13:08:31Z | - |
dc.date.available | 2016-03-31T13:08:31Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2002-02-22 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.other | 2002-OAK-0000002529 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/19162 | - |
dc.description.abstract | Conductive LaNiO3 (LNO) thin films were prepared on Si(000 by pulsed laser deposition and their microstructures were investigated using synchrotron X-ray scattering and atomic force microscopy. We observed that the surface morphology of the LNO thin films was extremely smooth with typically a 1.0-nm root-mean-squared roughness for films up to 360 nm in thickness and the film strain increased monotonically with the film thickness, suggesting that the LNO/Si(001) films be grown with a layer-like growth mode. Grown with the (001) preferred orientation, the LNO films showed a significant anisotropic structural order; the coherence length of the out-of-plane stacking order was one order of magnitude larger than that of the in-plane atomic order. (C) 2002 Elsevier Science B.V. All rights reserved. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.relation.isPartOf | THIN SOLID FILMS | - |
dc.subject | atomic force microscopy | - |
dc.subject | growth mechanism | - |
dc.subject | laser ablations | - |
dc.subject | X-ray diffraction | - |
dc.subject | THIN-FILMS | - |
dc.subject | PB(ZR0.53TI0.47)O-3 | - |
dc.subject | CRYSTALLIZATION | - |
dc.subject | ELECTRODES | - |
dc.subject | LAYERS | - |
dc.title | Microstructures of LaNiO3 films grown on Si(001) by pulsed laser deposition | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.identifier.doi | 10.1016/S0040-6090(01)01735-7 | - |
dc.author.google | Kim, SS | - |
dc.author.google | Kang, TS | - |
dc.author.google | Je, JH | - |
dc.relation.volume | 405 | - |
dc.relation.issue | 1-2 | - |
dc.relation.startpage | 117 | - |
dc.relation.lastpage | 121 | - |
dc.contributor.id | 10123980 | - |
dc.relation.journal | THIN SOLID FILMS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.405, no.1-2, pp.117 - 121 | - |
dc.identifier.wosid | 000174418600019 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 121 | - |
dc.citation.number | 1-2 | - |
dc.citation.startPage | 117 | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 405 | - |
dc.contributor.affiliatedAuthor | Je, JH | - |
dc.identifier.scopusid | 2-s2.0-0037154918 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 15 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | PB(ZR0.53TI0.47)O-3 | - |
dc.subject.keywordPlus | CRYSTALLIZATION | - |
dc.subject.keywordPlus | ELECTRODES | - |
dc.subject.keywordPlus | LAYERS | - |
dc.subject.keywordAuthor | atomic force microscopy | - |
dc.subject.keywordAuthor | growth mechanism | - |
dc.subject.keywordAuthor | laser ablations | - |
dc.subject.keywordAuthor | X-ray diffraction | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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