DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jun, SJ | - |
dc.contributor.author | Kim, SS | - |
dc.contributor.author | Je, JH | - |
dc.contributor.author | Lee, JC | - |
dc.date.accessioned | 2016-03-31T13:10:53Z | - |
dc.date.available | 2016-03-31T13:10:53Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2001-01 | - |
dc.identifier.issn | 1058-4587 | - |
dc.identifier.other | 2002-OAK-0000002408 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/19250 | - |
dc.description.abstract | Epitaxial (Ba-0.5,Sr-0.5)TiO3 (BST) thin films have been grown on Si substrate with a very thin yttria-stabilized zirconia (YSZ) buffer layer by pulsed-laser deposition. The epitaxially grown BST thin films experienced lattice distortion along the in-plane direction due to the tensile stress induced primarily by thermal stress during deposition. Crystallinity and microstructures of a strained BST thin films have been closely investigated using X-ray diffractometer, transmission electron microscope, and synchrotron X-ray. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | TAYLOR & FRANCIS LTD | - |
dc.relation.isPartOf | INTEGRATED FERROELECTRICS | - |
dc.subject | (Ba,Sr)TiO3 | - |
dc.subject | strain | - |
dc.subject | synchrotron X-ray | - |
dc.subject | RANDOM-ACCESS MEMORIES | - |
dc.subject | LAYER | - |
dc.title | Structural characterization of strained (Ba-0.5,Sr-0.5)TiO3 thin films grown on Si by synchrotron X-ray diffraction | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.author.google | Jun, SJ | - |
dc.author.google | Kim, SS | - |
dc.author.google | Je, JH | - |
dc.author.google | Lee, JC | - |
dc.relation.volume | 38 | - |
dc.relation.issue | 1-4 | - |
dc.relation.startpage | 845 | - |
dc.relation.lastpage | 854 | - |
dc.contributor.id | 10123980 | - |
dc.relation.journal | INTEGRATED FERROELECTRICS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Conference Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | INTEGRATED FERROELECTRICS, v.38, no.1-4, pp.845 - 854 | - |
dc.identifier.wosid | 000173066600023 | - |
dc.date.tcdate | 2018-03-23 | - |
dc.citation.endPage | 854 | - |
dc.citation.number | 1-4 | - |
dc.citation.startPage | 845 | - |
dc.citation.title | INTEGRATED FERROELECTRICS | - |
dc.citation.volume | 38 | - |
dc.contributor.affiliatedAuthor | Je, JH | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordAuthor | (Ba,Sr)TiO3 | - |
dc.subject.keywordAuthor | strain | - |
dc.subject.keywordAuthor | synchrotron X-ray | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
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