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Cited 5 time in webofscience Cited 6 time in scopus
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dc.contributor.authorKim, KS-
dc.contributor.authorJung, HC-
dc.contributor.authorKang, KS-
dc.contributor.authorLee, JK-
dc.contributor.authorJang, SS-
dc.contributor.authorHong, CK-
dc.date.accessioned2016-03-31T13:55:03Z-
dc.date.available2016-03-31T13:55:03Z-
dc.date.created2009-02-28-
dc.date.issued1998-04-
dc.identifier.issn1011-8861-
dc.identifier.other1998-OAK-0000000150-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/20824-
dc.description.abstractTwo-dimensional in-plane displacements and strains are measured using an electronic speckle pattern interferometry (ESPI) system based on the dual beam speckle interferometric method. Different types of specimens are used: a flat plate, a cracked-plate, and plate with a central hole of 12 mm diameter. Two-dimensional fringes obtained from real-time images are analyzed by an image analyser. The values of in-plane strains obtained by the ESPI technique show high accuracy compared with those measured by strain gages.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherKOREAN SOC MECHANICAL ENGINEERS-
dc.relation.isPartOfKSME INTERNATIONAL JOURNAL-
dc.subjectcoherent light-
dc.subjectelectronic speckle pattern interferometry (ESPI)-
dc.subjectfringe pattern-
dc.subjectimage processing-
dc.titleIn-plane strains measurement by using the electronic speckle pattern interferometry-
dc.typeArticle-
dc.contributor.college물리학과-
dc.identifier.doi10.1007/BF02947166-
dc.author.googleKIM, KS-
dc.author.googleJUNG, HC-
dc.author.googleKANG, KS-
dc.author.googleLEE, JK-
dc.author.googleJANG, SS-
dc.author.googleHONG, CK-
dc.relation.volume12-
dc.relation.issue2-
dc.relation.startpage215-
dc.relation.lastpage222-
dc.contributor.id10077432-
dc.relation.journalKSME INTERNATIONAL JOURNAL-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCIE-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationKSME INTERNATIONAL JOURNAL, v.12, no.2, pp.215 - 222-
dc.identifier.wosid000072913000007-
dc.date.tcdate2019-01-01-
dc.citation.endPage222-
dc.citation.number2-
dc.citation.startPage215-
dc.citation.titleKSME INTERNATIONAL JOURNAL-
dc.citation.volume12-
dc.contributor.affiliatedAuthorHong, CK-
dc.identifier.scopusid2-s2.0-0002292322-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc5-
dc.type.docTypeArticle-
dc.subject.keywordAuthorcoherent light-
dc.subject.keywordAuthorelectronic speckle pattern interferometry (ESPI)-
dc.subject.keywordAuthorfringe pattern-
dc.subject.keywordAuthorimage processing-
dc.relation.journalWebOfScienceCategoryEngineering, Mechanical-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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