In-plane strains measurement by using the electronic speckle pattern interferometry
SCIE
SCOPUS
- Title
- In-plane strains measurement by using the electronic speckle pattern interferometry
- Authors
- Kim, KS; Jung, HC; Kang, KS; Lee, JK; Jang, SS; Hong, CK
- Date Issued
- 1998-04
- Publisher
- KOREAN SOC MECHANICAL ENGINEERS
- Abstract
- Two-dimensional in-plane displacements and strains are measured using an electronic speckle pattern interferometry (ESPI) system based on the dual beam speckle interferometric method. Different types of specimens are used: a flat plate, a cracked-plate, and plate with a central hole of 12 mm diameter. Two-dimensional fringes obtained from real-time images are analyzed by an image analyser. The values of in-plane strains obtained by the ESPI technique show high accuracy compared with those measured by strain gages.
- Keywords
- coherent light; electronic speckle pattern interferometry (ESPI); fringe pattern; image processing
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/20824
- DOI
- 10.1007/BF02947166
- ISSN
- 1011-8861
- Article Type
- Article
- Citation
- KSME INTERNATIONAL JOURNAL, vol. 12, no. 2, page. 215 - 222, 1998-04
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- There are no files associated with this item.
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