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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ji, JM | - |
| dc.contributor.author | Seol, SK | - |
| dc.contributor.author | Je, JH | - |
| dc.contributor.author | Argunova, TS | - |
| dc.contributor.author | Hwu, Y | - |
| dc.contributor.author | Tsai, WL | - |
| dc.date.accessioned | 2016-04-01T02:04:37Z | - |
| dc.date.available | 2016-04-01T02:04:37Z | - |
| dc.date.created | 2009-02-28 | - |
| dc.date.issued | 2005-10-01 | - |
| dc.identifier.issn | 0168-9002 | - |
| dc.identifier.other | 2005-OAK-0000005448 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/24361 | - |
| dc.description.abstract | Using a scintillator-CCD imaging system, we successfully conducted a synchrotron white beam Laue topography (WBLT) experiment. It is demonstrated that this approach is able to provide a high-resolution microtopograph of p/p(+) Si (100). Optimum condition for high-resolution imaging is obtainable from the incident angle dependence of geometrical resolution. Black and white dislocation contrast suggests the potential of WBLT in characterizing dislocation structure. (c) 2005 Elsevier B.V. All rights reserved. | - |
| dc.description.statementofresponsibility | X | - |
| dc.language | English | - |
| dc.publisher | ELSEVIER SCIENCE BV | - |
| dc.relation.isPartOf | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | - |
| dc.subject | X-ray diffraction | - |
| dc.subject | X-ray topography | - |
| dc.subject | dislocation | - |
| dc.subject | X-RAY TOPOGRAPHY | - |
| dc.subject | SILICON | - |
| dc.subject | CRYSTALS | - |
| dc.subject | CONTRAST | - |
| dc.subject | DEFECTS | - |
| dc.title | White beam Laue topography using a scintillator-CCD combination | - |
| dc.type | Article | - |
| dc.contributor.college | 신소재공학과 | - |
| dc.identifier.doi | 10.1016/j.nima.2005.07.049 | - |
| dc.author.google | Ji, JM | - |
| dc.author.google | Seol, SK | - |
| dc.author.google | Je, JH | - |
| dc.author.google | Argunova, TS | - |
| dc.author.google | Hwu, Y | - |
| dc.author.google | Tsai, WL | - |
| dc.relation.volume | 551 | - |
| dc.relation.issue | 1 | - |
| dc.relation.startpage | 152 | - |
| dc.relation.lastpage | 156 | - |
| dc.contributor.id | 10123980 | - |
| dc.relation.journal | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | - |
| dc.relation.index | SCI급, SCOPUS 등재논문 | - |
| dc.relation.sci | SCI | - |
| dc.collections.name | Conference Papers | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.551, no.1, pp.152 - 156 | - |
| dc.identifier.wosid | 000232386300018 | - |
| dc.date.tcdate | 2018-03-23 | - |
| dc.citation.endPage | 156 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 152 | - |
| dc.citation.title | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | - |
| dc.citation.volume | 551 | - |
| dc.contributor.affiliatedAuthor | Je, JH | - |
| dc.identifier.scopusid | 2-s2.0-24944461424 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.type.docType | Article; Proceedings Paper | - |
| dc.subject.keywordPlus | X-RAY TOPOGRAPHY | - |
| dc.subject.keywordPlus | SILICON | - |
| dc.subject.keywordPlus | CRYSTALS | - |
| dc.subject.keywordPlus | CONTRAST | - |
| dc.subject.keywordPlus | DEFECTS | - |
| dc.subject.keywordAuthor | X-ray diffraction | - |
| dc.subject.keywordAuthor | X-ray topography | - |
| dc.subject.keywordAuthor | dislocation | - |
| dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
| dc.relation.journalWebOfScienceCategory | Nuclear Science & Technology | - |
| dc.relation.journalWebOfScienceCategory | Physics, Nuclear | - |
| dc.relation.journalWebOfScienceCategory | Physics, Particles & Fields | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Instruments & Instrumentation | - |
| dc.relation.journalResearchArea | Nuclear Science & Technology | - |
| dc.relation.journalResearchArea | Physics | - |
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Related Researcher
- 제정호JE, JUNG HO
- Dept of Materials Science & Enginrg