White beam Laue topography using a scintillator-CCD combination
SCIE
SCOPUS
- Title
- White beam Laue topography using a scintillator-CCD combination
- Authors
- Ji, JM; Seol, SK; Je, JH; Argunova, TS; Hwu, Y; Tsai, WL
- Date Issued
- 2005-10-01
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- Using a scintillator-CCD imaging system, we successfully conducted a synchrotron white beam Laue topography (WBLT) experiment. It is demonstrated that this approach is able to provide a high-resolution microtopograph of p/p(+) Si (100). Optimum condition for high-resolution imaging is obtainable from the incident angle dependence of geometrical resolution. Black and white dislocation contrast suggests the potential of WBLT in characterizing dislocation structure. (c) 2005 Elsevier B.V. All rights reserved.
- Keywords
- X-ray diffraction; X-ray topography; dislocation; X-RAY TOPOGRAPHY; SILICON; CRYSTALS; CONTRAST; DEFECTS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/24361
- DOI
- 10.1016/j.nima.2005.07.049
- ISSN
- 0168-9002
- Article Type
- Article
- Citation
- NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 551, no. 1, page. 152 - 156, 2005-10-01
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