DC Field | Value | Language |
---|---|---|
dc.contributor.author | Seo, SY | - |
dc.contributor.author | Kwak, CH | - |
dc.contributor.author | Lee, YB | - |
dc.contributor.author | Kim, SH | - |
dc.contributor.author | Park, SH | - |
dc.contributor.author | Han, SW | - |
dc.date.accessioned | 2016-04-01T02:54:27Z | - |
dc.date.available | 2016-04-01T02:54:27Z | - |
dc.date.created | 2010-05-11 | - |
dc.date.issued | 2008-03 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.other | 2008-OAK-0000021223 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/25963 | - |
dc.description.abstract | This study reports the structural and the magnetic properties of Zn1-xFexO (ZnFeO) films with Fe composition ratios of 0.03 - 0.07. High-quality Zn1-xFexO thin films with a mean thickness of 500 nm were fabricated on alpha-sapphire (0001) substrates by RF magnetron sputtering. The structures of the ZnFeO thin films were examined using various techniques. X-ray diffraction revealed the films to have a well-ordered wurtzite structure without any extra phases. However, the ZnO (0002) diffraction peak shifted gradually from 2 theta = 34.378 degrees to 34.142 degrees with increasing Fe concentration from 0.03 to 0.07. This corresponds to a lattice constant increase of 0.035 angstrom. X-ray photoelectron spectroscopy (XPS) measurements were employed to characterize the valence state of the Fe ions in the films. The XPS revealed the coexistence of Fe3+ and Fe2+ ions in the films. The DC-magnetization measurements demonstrated that the ZnFeO films were ferromagnetic at 5 K. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | Korean Physical Society | - |
dc.relation.isPartOf | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.subject | ZnFeO | - |
dc.subject | film | - |
dc.subject | sputtering | - |
dc.subject | ferromagnetic | - |
dc.subject | DMS | - |
dc.subject | DOPED ZNO | - |
dc.subject | SEMICONDUCTORS | - |
dc.subject | FERROMAGNETISM | - |
dc.title | Structural and Magnetic Properties of Zn1-xFexO Thin Films Synthesized by RF Magnetron Sputtering | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.identifier.doi | 10.3938/jkps.52.805 | - |
dc.author.google | Seo, SY | - |
dc.author.google | Kwak, CH | - |
dc.author.google | Lee, YB | - |
dc.author.google | Kim, SH | - |
dc.author.google | Park, SH | - |
dc.author.google | Han, SW | - |
dc.relation.volume | 52 | - |
dc.relation.issue | 3 | - |
dc.relation.startpage | 805 | - |
dc.relation.lastpage | 809 | - |
dc.contributor.id | 10077433 | - |
dc.relation.journal | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.52, no.3, pp.805 - 809 | - |
dc.identifier.wosid | 000254057700021 | - |
dc.date.tcdate | 2019-02-01 | - |
dc.citation.endPage | 809 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 805 | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 52 | - |
dc.contributor.affiliatedAuthor | Kim, SH | - |
dc.identifier.scopusid | 2-s2.0-41949113608 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 12 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | DOPED ZNO | - |
dc.subject.keywordPlus | SEMICONDUCTORS | - |
dc.subject.keywordPlus | FERROMAGNETISM | - |
dc.subject.keywordAuthor | ZnFeO | - |
dc.subject.keywordAuthor | film | - |
dc.subject.keywordAuthor | sputtering | - |
dc.subject.keywordAuthor | ferromagnetic | - |
dc.subject.keywordAuthor | DMS | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Physics | - |
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