Structural and Magnetic Properties of Zn1-xFexO Thin Films Synthesized by RF Magnetron Sputtering
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- Title
- Structural and Magnetic Properties of Zn1-xFexO Thin Films Synthesized by RF Magnetron Sputtering
- Authors
- Seo, SY; Kwak, CH; Lee, YB; Kim, SH; Park, SH; Han, SW
- Date Issued
- 2008-03
- Publisher
- Korean Physical Society
- Abstract
- This study reports the structural and the magnetic properties of Zn1-xFexO (ZnFeO) films with Fe composition ratios of 0.03 - 0.07. High-quality Zn1-xFexO thin films with a mean thickness of 500 nm were fabricated on alpha-sapphire (0001) substrates by RF magnetron sputtering. The structures of the ZnFeO thin films were examined using various techniques. X-ray diffraction revealed the films to have a well-ordered wurtzite structure without any extra phases. However, the ZnO (0002) diffraction peak shifted gradually from 2 theta = 34.378 degrees to 34.142 degrees with increasing Fe concentration from 0.03 to 0.07. This corresponds to a lattice constant increase of 0.035 angstrom. X-ray photoelectron spectroscopy (XPS) measurements were employed to characterize the valence state of the Fe ions in the films. The XPS revealed the coexistence of Fe3+ and Fe2+ ions in the films. The DC-magnetization measurements demonstrated that the ZnFeO films were ferromagnetic at 5 K.
- Keywords
- ZnFeO; film; sputtering; ferromagnetic; DMS; DOPED ZNO; SEMICONDUCTORS; FERROMAGNETISM
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/25963
- DOI
- 10.3938/jkps.52.805
- ISSN
- 0374-4884
- Article Type
- Article
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 52, no. 3, page. 805 - 809, 2008-03
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