DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ji Hoon Seo | - |
dc.contributor.author | Gang Jun Kim | - |
dc.contributor.author | Dong hee Son | - |
dc.contributor.author | Lee, NH | - |
dc.contributor.author | Yong ha Kang | - |
dc.contributor.author | Kang, B | - |
dc.date.accessioned | 2017-07-19T13:32:05Z | - |
dc.date.available | 2017-07-19T13:32:05Z | - |
dc.date.created | 2017-02-15 | - |
dc.date.issued | 2016-08 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/37176 | - |
dc.description.abstract | We propose a method to predict the length dependency of the magnitude of degradation caused by negative bias temperature instability (NBTI) stress applied to a p-MOSFET. Threshold voltage degradation ΔV th varied according to the drain bias V d, during the measurement of drain current I d. The depletion length L dep into the channel was calculated based on a particular V d value and the channel doping concentration. L dep was used to extract the channel edge region length L edge, then the center channel region length L cen was obtained by subtracting L edge from the gate length L gate. We proposed an equation that uses L dep, L cen, L edge and degree of ΔV th variation to calculate ΔV th according to L gate while the p-MOSFET is under NBTI stress. Equation estimates of ΔV th at different L gate were similar to measurements. | - |
dc.language | English | - |
dc.publisher | JAPAN SOC APPLIED PHYSICS | - |
dc.relation.isPartOf | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
dc.title | Method to predict length dependency of negative bias temperature instability degradation in p-MOSFETs | - |
dc.type | Article | - |
dc.identifier.doi | 10.7567/JJAP.55.08PD03 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS, v.55, no.8 | - |
dc.identifier.wosid | 000380818100016 | - |
dc.date.tcdate | 2018-03-12 | - |
dc.citation.number | 8 | - |
dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
dc.citation.volume | 55 | - |
dc.contributor.affiliatedAuthor | Ji Hoon Seo | - |
dc.contributor.affiliatedAuthor | Kang, B | - |
dc.identifier.scopusid | 2-s2.0-85053000920 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | NBTI | - |
dc.subject.keywordPlus | RECOVERY | - |
dc.subject.keywordPlus | MODEL | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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