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dc.contributor.authorCHOI, JOONYONG-
dc.contributor.authorKihyun Kim-
dc.contributor.authorJUN-SIK, YOON-
dc.contributor.authorBAEK, CHANG KI-
dc.date.accessioned2018-05-10T06:42:27Z-
dc.date.available2018-05-10T06:42:27Z-
dc.date.created2018-01-25-
dc.date.issued2017-02-14-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/41565-
dc.publisherSK하이닉스, 한국반도체산업협회-
dc.relation.isPartOfTHE 24TH KOREAN CONFERENCE ON SEMICONDUCTORS-
dc.relation.isPartOf--
dc.titleDC characteristics in polysilicon nanowire tunneling field-effect transistors-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationTHE 24TH KOREAN CONFERENCE ON SEMICONDUCTORS-
dc.citation.conferenceDate2017-02-13-
dc.citation.conferencePlaceKO-
dc.citation.titleTHE 24TH KOREAN CONFERENCE ON SEMICONDUCTORS-
dc.contributor.affiliatedAuthorKihyun Kim-
dc.contributor.affiliatedAuthorBAEK, CHANG KI-
dc.description.journalClass2-
dc.description.journalClass2-

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백창기BAEK, CHANG KI
Dept. Convergence IT Engineering
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