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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김병섭 | - |
| dc.date.accessioned | 2018-05-24T01:44:11Z | - |
| dc.date.available | 2018-05-24T01:44:11Z | - |
| dc.date.created | 2017-08-23 | - |
| dc.date.issued | 2017-04-28 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/47863 | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | IEEE CAS Society Korean Workshop on Circuits and Systems | - |
| dc.relation.isPartOf | IEEE CAS SOCIETY KOREAN WORKSHOP ON CIRCUITS AND SYSTEMS | - |
| dc.title | A Coefficient-Error-Robust FFE TX with 230% Eye Variation Improvement Without Calibration in 65-nm CMOS Technology | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | IEEE CAS Society Korean Workshop on Circuits and Systems | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | IEEE CAS Society Korean Workshop on Circuits and Systems | - |
| dc.contributor.affiliatedAuthor | 김병섭 | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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- 김병섭KIM, BYUNGSUB
- Dept of Electrical Enginrg