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A Coefficient-Error-Robust FFE TX with 230% Eye Variation Improvement Without Calibration in 65-nm CMOS Technology
- Title
- A Coefficient-Error-Robust FFE TX with 230% Eye Variation Improvement Without Calibration in 65-nm CMOS Technology
- Authors
- 김병섭
- Date Issued
- 2017-04-28
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE CAS Society Korean Workshop on Circuits and Systems, 2017-04-28
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- 김병섭KIM, BYUNGSUB
- Dept of Electrical Enginrg