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dc.contributor.author조길원-
dc.contributor.author강보석-
dc.contributor.author문병호-
dc.date.accessioned2018-05-24T02:48:28Z-
dc.date.available2018-05-24T02:48:28Z-
dc.date.created2017-02-16-
dc.date.issued2016-11-28-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/48190-
dc.publisherMaterial Research Society-
dc.relation.isPartOf2016 MRS Fall Meeting-
dc.titleBias-Stress-Induced Charge Trapping in Organic Transistor-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2016 MRS Fall Meeting-
dc.citation.conferenceDate2016-11-27-
dc.citation.conferencePlaceUS-
dc.citation.title2016 MRS Fall Meeting-
dc.contributor.affiliatedAuthor조길원-
dc.description.journalClass1-
dc.description.journalClass1-

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조길원CHO, KIL WON
Dept. of Chemical Enginrg
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