Bias-Stress-Induced Charge Trapping in Organic Transistor
- Title
- Bias-Stress-Induced Charge Trapping in Organic Transistor
- Authors
- 조길원; 강보석; 문병호
- Date Issued
- 2016-11-28
- Publisher
- Material Research Society
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/48190
- Article Type
- Conference
- Citation
- 2016 MRS Fall Meeting, 2016-11-28
- Files in This Item:
- There are no files associated with this item.
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