Article
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Aslam, Muhammad | - |
| dc.contributor.author | Arif, Osama H. | - |
| dc.contributor.author | Jun, Chi-Hyuck | - |
| dc.date.accessioned | 2018-06-15T05:26:27Z | - |
| dc.date.available | 2018-06-15T05:26:27Z | - |
| dc.date.created | 2017-12-21 | - |
| dc.date.issued | 2017-10 | - |
| dc.identifier.issn | 2169-3536 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/50478 | - |
| dc.description.abstract | In this paper, a new control chart using sudden death testing is designed by assuming that the lifetime/failure time of the product follows the Weibull distribution. The structure of the proposed chart is presented. The control chart coefficient is determined using some specified average run length for the in control process and the shifted process. Simulation study is given for the illustration purpose. | - |
| dc.language | English | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.relation.isPartOf | IEEE Access | - |
| dc.title | A New Control Chart for Monitoring Reliability Using Sudden Death Testing Under Weibull Distribution | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1109/ACCESS.2017.2764953 | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | IEEE Access, v.5, pp.23358 - 23365 | - |
| dc.identifier.wosid | 000415170700033 | - |
| dc.date.tcdate | 2018-03-23 | - |
| dc.citation.endPage | 23365 | - |
| dc.citation.startPage | 23358 | - |
| dc.citation.title | IEEE Access | - |
| dc.citation.volume | 5 | - |
| dc.contributor.affiliatedAuthor | Jun, Chi-Hyuck | - |
| dc.identifier.scopusid | 2-s2.0-85032653556 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | Y | - |
| dc.type.docType | Article | - |
| dc.subject.keywordPlus | NP CONTROL CHART | - |
| dc.subject.keywordPlus | EWMA CHARTS | - |
| dc.subject.keywordPlus | ATTRIBUTES | - |
| dc.subject.keywordPlus | LIFETIMES | - |
| dc.subject.keywordPlus | PERCENTILES | - |
| dc.subject.keywordPlus | ALARM | - |
| dc.subject.keywordPlus | LIFE | - |
| dc.subject.keywordAuthor | Life test | - |
| dc.subject.keywordAuthor | Weibull distribution | - |
| dc.subject.keywordAuthor | average run length | - |
| dc.relation.journalWebOfScienceCategory | Computer Science, Information Systems | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Telecommunications | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Computer Science | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Telecommunications | - |
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Related Researcher
- 전치혁JUN, CHI HYUCK
- Dept of Industrial & Management Enginrg