Impact of OFF-state Degradation under Dynamic Stress on Reliability of Nanoscale n-Channel Metal-Oxide Semiconductor Field-Effect Transistors at Elevated Temperature
- Title
- Impact of OFF-state Degradation under Dynamic Stress on Reliability of Nanoscale n-Channel Metal-Oxide Semiconductor Field-Effect Transistors at Elevated Temperature
- Authors
- 강봉구; 이남현
- Date Issued
- 2011-09-29
- Publisher
- THE JAPAN SOCIETY OF APPLIED PHYSICS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/59926
- Article Type
- Conference
- Citation
- SSDM(International Conference on Solid State Devices and Materials), 2011-09-29
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- There are no files associated with this item.
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