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Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects
- Title
- Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects
- Authors
- 백창기
- Date Issued
- 2013-06-26
- Publisher
- DRC
- Article Type
- Conference
- Citation
- 2013 Annual Device Research Conference (DRC), 2013-06-26
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Related Researcher
- 백창기BAEK, CHANG KI
- Dept. Convergence IT Engineering