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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김재준 | - |
| dc.contributor.author | Barry Linder | - |
| dc.contributor.author | Rahul Rao | - |
| dc.contributor.author | Tae-Hyoung Kim | - |
| dc.contributor.author | Pong-Fei Lu | - |
| dc.contributor.author | Keith Jenkins | - |
| dc.contributor.author | Chris H Kim | - |
| dc.contributor.author | Aditya Bansal | - |
| dc.contributor.author | Saibal Mukhopadyay | - |
| dc.contributor.author | Ching-Te Chuang | - |
| dc.date.accessioned | 2018-06-18T10:30:46Z | - |
| dc.date.available | 2018-06-18T10:30:46Z | - |
| dc.date.created | 2014-03-09 | - |
| dc.date.issued | 2011-04-10 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/66323 | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | IEEE International Reliability Physics Symposium (IRPS) | - |
| dc.relation.isPartOf | PROCEEDING OF IRPS | - |
| dc.title | Reliability Monitoring Ring Oscillator Structures for Isolated/Combined NBTI and PBTI Measurement in High-K Metal Gate Technologies | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | IEEE International Reliability Physics Symposium (IRPS), pp.4.1 - 4.4 | - |
| dc.citation.conferenceDate | 2011-04-10 | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.endPage | 4.4 | - |
| dc.citation.startPage | 4.1 | - |
| dc.citation.title | IEEE International Reliability Physics Symposium (IRPS) | - |
| dc.contributor.affiliatedAuthor | 김재준 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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- 김재준KIM, JAE JOON
- Dept. Convergence IT Engineering