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dc.contributor.author이종람-
dc.contributor.author김범준-
dc.contributor.author송양희-
dc.contributor.author손준호-
dc.contributor.author유학기-
dc.date.accessioned2018-06-18T11:10:43Z-
dc.date.available2018-06-18T11:10:43Z-
dc.date.created2014-04-01-
dc.date.issued2011-11-28-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/67008-
dc.publisherENGE 2011-
dc.relation.isPartOfENGE 2011-
dc.relation.isPartOfENGE 2011-
dc.titleThermal Degradation Mechanism of Ti/Al based Ohmic Contacts to N-face n-GaN-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationENGE 2011-
dc.citation.conferencePlaceKO-
dc.citation.titleENGE 2011-
dc.contributor.affiliatedAuthor이종람-
dc.description.journalClass2-
dc.description.journalClass2-

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이종람LEE, JONG LAM
Dept of Materials Science & Enginrg
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