Thermal Degradation Mechanism of Ti/Al based Ohmic Contacts to N-face n-GaN
- Title
- Thermal Degradation Mechanism of Ti/Al based Ohmic Contacts to N-face n-GaN
- Authors
- 이종람; 김범준; 송양희; 손준호; 유학기
- Date Issued
- 2011-11-28
- Publisher
- ENGE 2011
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/67008
- Article Type
- Conference
- Citation
- ENGE 2011, 2011-11-28
- Files in This Item:
- There are no files associated with this item.
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