Atom Probe Tomography Analyses of Thin poly-Si/SiO2 Multi-layer and Appropriate
- Title
- Atom Probe Tomography Analyses of Thin poly-Si/SiO2 Multi-layer and Appropriate
- Authors
- 박찬경; 김보화; 김영태
- Date Issued
- 2013-10-24
- Publisher
- 대한금속재료학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/67024
- Article Type
- Conference
- Citation
- 추계 금속재료학회, 2013-10-24
- Files in This Item:
- There are no files associated with this item.
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