C-V Characteristics and Analysis of Undoped Gate-All-Around Nanowire FET Array
- Title
- C-V Characteristics and Analysis of Undoped Gate-All-Around Nanowire FET Array
- Authors
- 백창기
- Date Issued
- 2010-09-23
- Publisher
- International Conference on Solid State Devices and Materials
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/68468
- Article Type
- Conference
- Citation
- 2010 International Conference on Solid State Devices and Materials, 2010-09-23
- Files in This Item:
- There are no files associated with this item.
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