Length dependency expectation of negative bias temperature instability
- Title
- Length dependency expectation of negative bias temperature instability
- Authors
- 강봉구; 서지훈; 김강준; 손동희
- Date Issued
- 2015-11-02
- Publisher
- The Japan Society of Applied Physics
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/70610
- Article Type
- Conference
- Citation
- International Workshop on Dielectric thin films for future electron devices(IWDTF), 2015-11-02
- Files in This Item:
- There are no files associated with this item.
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