Self-inspection for Defect Detection in Photomask Image
- Title
- Self-inspection for Defect Detection in Photomask Image
- Authors
- 정홍
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/89979
- Article Type
- Conference
- Citation
- The 2008 International Conference on Convergence and Information Technology, page. 364 - 368
- Files in This Item:
- There are no files associated with this item.
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