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Cited 30 time in webofscience Cited 36 time in scopus
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dc.contributor.authorJang, HW-
dc.contributor.authorUrbanek, W-
dc.contributor.authorYoo, MC-
dc.contributor.authorLee, JL-
dc.date.accessioned2015-06-25T01:08:05Z-
dc.date.available2015-06-25T01:08:05Z-
dc.date.created2009-02-28-
dc.date.issued2002-04-22-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000002580en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9432-
dc.description.abstractWe report a low-resistant and high-transparent Ru-based ohmic contact on p-type GaN through oxidation annealing under O-2 atmosphere. A low resistivity of 4.5x10(-5) Omega cm(2) and high light transmittance (84.6%) were simultaneously obtained from oxidized Ru (50 Angstrom)/Ni (50 Angstrom) contact. The RuO2 formed on p-type GaN played a role in reducing the effective Schottky barrier height for injection of holes and NiO layer produced on the RuO2 acted as a diffusion barrier for the outdiffusion of released Ga and N atoms, resulting in the reduction of the contact resistivity as well as the enhancement of light transmission. (C) 2002 American Institute of Physics.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleLow-resistant and high-transparent Ru/Ni ohmic contact on p-type GaN-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.1474609-
dc.author.googleJang, HWen_US
dc.author.googleUrbanek, Wen_US
dc.author.googleLee, JLen_US
dc.author.googleYoo, MCen_US
dc.relation.volume80en_US
dc.relation.issue16en_US
dc.relation.startpage2937en_US
dc.relation.lastpage2939en_US
dc.contributor.id10105416en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.80, no.16, pp.2937 - 2939-
dc.identifier.wosid000175068900040-
dc.date.tcdate2019-01-01-
dc.citation.endPage2939-
dc.citation.number16-
dc.citation.startPage2937-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume80-
dc.contributor.affiliatedAuthorLee, JL-
dc.identifier.scopusid2-s2.0-79956011409-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc27-
dc.description.scptc31*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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이종람LEE, JONG LAM
Dept of Materials Science & Enginrg
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