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Cited 62 time in webofscience Cited 67 time in scopus
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dc.contributor.authorChen, KX-
dc.contributor.authorDai, Q-
dc.contributor.authorLee, W-
dc.contributor.authorKim, JK-
dc.contributor.authorSchubert, EF-
dc.contributor.authorGr-
dc.contributor.authorusky, J-
dc.contributor.authorMendrick, M-
dc.contributor.authorLi, X-
dc.contributor.authorSmart, JA-
dc.date.accessioned2015-06-25T01:19:55Z-
dc.date.available2015-06-25T01:19:55Z-
dc.date.created2009-09-04-
dc.date.issued2008-11-10-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000018672en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9613-
dc.description.abstractThe effect of edge and screw dislocations on the electrical and optical properties of n-type Al0.34Ga0.66N is investigated. It is found that edge dislocations strongly affect the electrical properties of n-type Al0.34Ga0.66N. Both free carrier concentration and mobility decrease with increasing edge dislocation density. Edge dislocations also enhance nonradiative recombination, which is indicated by decreasing near-band-edge UV as well as parasitic blue photoluminescence. The UV/blue ratio is found to be independent of the edge dislocation density but strongly depends on the Si doping concentration.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleEffect of dislocations on electrical and optical properties of n-type Al0.34Ga0.66N-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.3021076-
dc.author.googleChen, KXen_US
dc.author.googleDai, Qen_US
dc.author.googleSmart, JAen_US
dc.author.googleLi, Xen_US
dc.author.googleMendrick, Men_US
dc.author.googleGrandusky, Jen_US
dc.author.googleSchubert, EFen_US
dc.author.googleKim, JKen_US
dc.author.googleLee, Wen_US
dc.relation.volume93en_US
dc.relation.issue19en_US
dc.contributor.id10100864en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.93, no.19-
dc.identifier.wosid000260944100050-
dc.date.tcdate2019-01-01-
dc.citation.number19-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume93-
dc.contributor.affiliatedAuthorKim, JK-
dc.identifier.scopusid2-s2.0-56249125264-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc34-
dc.description.scptc40*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusTHREADING DISLOCATIONS-
dc.subject.keywordPlusEDGE DISLOCATIONS-
dc.subject.keywordPlusEPITAXIAL GAN-
dc.subject.keywordPlusCATHODOLUMINESCENCE-
dc.subject.keywordPlusSCATTERING-
dc.subject.keywordPlusLAYERS-
dc.subject.keywordAuthoraluminium compounds-
dc.subject.keywordAuthorcarrier density-
dc.subject.keywordAuthorcarrier mobility-
dc.subject.keywordAuthordislocation density-
dc.subject.keywordAuthordoping profiles-
dc.subject.keywordAuthoredge dislocations-
dc.subject.keywordAuthorgallium compounds-
dc.subject.keywordAuthorIII-V semiconductors-
dc.subject.keywordAuthorphotoluminescence-
dc.subject.keywordAuthorscrew dislocations-
dc.subject.keywordAuthorwide band gap semiconductors-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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김종규KIM, JONG KYU
Dept of Materials Science & Enginrg
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