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Cited 23 time in webofscience Cited 25 time in scopus
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dc.contributor.authorJun Ho Son-
dc.contributor.authorLee, JL-
dc.date.accessioned2015-06-25T01:25:37Z-
dc.date.available2015-06-25T01:25:37Z-
dc.date.created2011-04-11-
dc.date.issued2010-07-19-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000021496en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9705-
dc.description.abstractThe effects of piezoelectric polarization on efficiency droop in InGaN/GaN light-emitting diodes (LEDs) have been investigated using numerical analysis. The simulation results showed that the severe band bending in InGaN quantum-well was improved as the piezoelectric polarization is reduced, resulting in the improved overlap of electron and hole wave functions. As a results, the internal quantum efficiency increases and efficiency droop significantly reduces. The reduction in piezoelectric polarization could be derived by applying a tensile stress to relax compressive stress in GaN epilayer, improving the efficiency droop of vertical-structure LEDs, agree well with simulation ones. (C) 2010 American Institute of Physics. [doi:10.1063/1.3464976]-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMERICAN INSTITUTE OF PHYSICS-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleNumerical analysis of efficiency droop induced by piezoelectric polarization in InGaN/GaN light-emitting diodes-
dc.typeArticle-
dc.contributor.college첨단재료과학부en_US
dc.identifier.doi10.1063/1.3464976-
dc.author.googleSon, JHen_US
dc.author.googleLee, JLen_US
dc.relation.volume97en_US
dc.relation.issue3en_US
dc.relation.startpage32109en_US
dc.contributor.id10105416en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.97, no.3, pp.32109-
dc.identifier.wosid000280255800048-
dc.date.tcdate2019-01-01-
dc.citation.number3-
dc.citation.startPage32109-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume97-
dc.contributor.affiliatedAuthorLee, JL-
dc.identifier.scopusid2-s2.0-77956212795-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc20-
dc.description.scptc21*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusGAN-
dc.subject.keywordPlusSI(111)-
dc.subject.keywordPlusSTRESS-
dc.subject.keywordAuthorbending-
dc.subject.keywordAuthorcompressive strength-
dc.subject.keywordAuthorgallium compounds-
dc.subject.keywordAuthorIII-V semiconductors-
dc.subject.keywordAuthorindium compounds-
dc.subject.keywordAuthorinternal stresses-
dc.subject.keywordAuthorlight emitting diodes-
dc.subject.keywordAuthorpiezoelectricity-
dc.subject.keywordAuthorsemiconductor quantum wells-
dc.subject.keywordAuthortensile strength-
dc.subject.keywordAuthorwave functions-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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이종람LEE, JONG LAM
Dept of Materials Science & Enginrg
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